DX8080
PL Engineering Ltd. introduces new complex device TEM Expert DX8080 for detailed testing of performance of thermoelectric material (TEM).
The DX8080 is developed for laboratory testing of thermoelectric (TE) properties of the n/p-type material based on Bi2Te3 when measuring pellets.
The tests are performed in vacuum at a given ambient (sample) temperature.
- Seebeck coefficient a,
- Electrical Conductivity s
- Figure-of-Merit Z
- Thermal conductivity k (is calculated)
- Investigations of the properties in a temperature range
- Wholly automated vacuum testing
SPECIFICATIONS
DX8080 Measuring Parameters
| Measured parameter | Designation | Units | Range | Accuracy, % |
| Seebeck Coefficient, a | | mV/K | 100...300 | 3.5 |
| Electrical Conductivity | s | 1/(Ohm·cm) | 300...2000 | 5 |
| Figure-of-Merit | Z | 1000/K | 0...4 | 7 |
Sample Dimensions
| Parameter | Units | Min | Max |
| Length | mm | 1.0 | 5.0 |
| Cross-section | mm2 | - | 3x3 |
| Length to Cross-Section Ratio | mm-1 | 0.5 | 1.0 |
Sample Dimensions
| Parameter | Units | Min | Max |
| Length | mm | 1.0 | 5.0 |
| Cross-section | mm2 | - | 3x3 |
| Length to Cross-Section Ratio | mm-1 | 0.5 | 1.0 |
