DX8080

PL Engineering Ltd. introduces new complex device TEM Expert DX8080 for detailed testing of performance of thermoelectric material (TEM). The DX8080 is developed for laboratory testing of thermoelectric (TE) properties of the n/p-type material based on Bi2Te3 when measuring pellets. The tests are performed in vacuum at a given ambient (sample) temperature.

DX8080 key features

  • Seebeck coefficient a,
  • Electrical Conductivity s
  • Figure-of-Merit Z
  • Thermal conductivity k (is calculated)
  • Investigations of the properties in a temperature range
  • Wholly automated vacuum testing

SPECIFICATIONS

DX8080 Measuring Parameters

Measured parameterDesignationUnitsRangeAccuracy, %
Seebeck Coefficient, a mV/K100...3003.5
Electrical Conductivitys1/(Ohm·cm)300...20005
Figure-of-MeritZ1000/K0...47

Sample Dimensions

ParameterUnitsMinMax
Lengthmm1.05.0
Cross-sectionmm2-3x3
Length to Cross-Section Ratiomm-10.51.0

Sample Dimensions

ParameterUnitsMinMax
Lengthmm1.05.0
Cross-sectionmm2-3x3
Length to Cross-Section Ratiomm-10.51.0

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